Non-Contact Surface Metrology

Surface metrology is the measurement and analysis of surface texture, form, and features to understand how a part will perform within its application.

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Advanced 3D Surface Measurement

Non-contact 3D surface measurement provides a precise, non-destructive way to evaluate surface form, texture, and fine features. It enables detailed characterization of micro- and nano-scale features on natural or manufactured surfaces by capturing dense 3D spatial data with exceptional accuracy and precision. Advanced optical imaging and laser-based technologies make it possible to analyze delicate, reflective, or transparent surfaces that are difficult to measure with styli or tactile probes.

Surface metrology systems combine high-resolution imaging with multi-modal measurement technologies to produce repeatable and reliable results for research, quality control, and production environments.

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Optical 3D Surface Metrology

Optical profilometry systems collect millions of data points to evaluate surface texture, roughness, flatness, step height, and functional surface parameters across a wide range of materials and finishes. Sensofar systems integrate multiple optical technologies into a single platform, empowering users to select the most effective technique for each surface and application.

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Confocal-microscopy

Confocal Microscopy

Measures surface height across smooth to very rough surfaces, providing high-resolution data on complex geometries.

Interferometry

Interferometry

Measures very smooth and continuous surfaces to moderately rough surfaces with extremely high vertical resolution, ideal for precision surface analysis.

Ai-Focus-Variation

Ai Focus Variation

Measures the shape of large, steep, and rough surfaces, performing well on high-slope and irregular geometries.

Spectroscopic-Reflectometry

Spectroscopic Reflectometry

Measures the thickness of transparent and semi-transparent layers, commonly used for coatings and thin films.

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Laser Sensor Surface Scanning

Laser-based probes project a laser onto the surface of a part and measure reflected light to determine height and form. Laser-based surface metrology enables sub-micron resolution on specular and light-scattering materials. This type of surface analysis technology is mounted on vision and multisensor CMMs using fixed or retractable probe configurations.

Rainbow-Probe
Rainbow Probe

The Rainbow Probe uses changes in the optical spectrum of part-to-probe spacing to measure surfaces without contact. It captures high-resolution surface data on a wide range of materials, including reflective and transparent surfaces, and integrates into OGP SmartScope measurement systems.

TeleStar-Probe
TeleStar Probe

The TeleStar Probe uses interferometric laser measurement to capture non-contact surface contour and profile data. It is well suited for precise form and height analysis on complex surfaces and integrates into OGP SmartScope measurement systems.