S neox Highlights
4-in-1 measurement technologies in one sensor head: Confocal, Interferometry (PSI/ePSI/CSI), Ai Focus Variation, and Thin-Film for transparent layers. Switch instantly to the optimal method per surface/feature.
Very fast acquisition with new camera and smart algorithms (data acquisition up to 180 fps; standard measurements up to 5× faster).
Sub-nanometer sensitivity using a Nomarski prism to resolve features not visible in brightfield or confocal images.
Comprehensive software workflow for acquisition, analysis, reporting, automation and SDK integration.
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Applications & Use Cases
Full-field 3D topography and surface texture parameters for QA/FA/R&D.
Dimensional metrology (critical dimensions, form, roughness/ waviness) with nanometric to micrometric vertical resolution.
Thin-film thickness and multilayer evaluation (with thin-film module).
Hybrid & challenging surfaces (steep slopes, rough or reflective materials) via Ai Focus Variation and Confocal/Interferometry.
Designed for Industry & Research
From precision manufacturing QA to advanced materials R&D, S neox supports medical & dental, aerospace, automotive, electronics, plastics/additive, oil & gas, and academic labs.
SensoSCAN provides an intuitive interface for measurement setup, automatic routines, data analysis, and reporting; it also supports automation tools and SDK for system integration.
Specifications Snapshot
- Acquisition speed: up to 180 fps; typical jobs ~5× faster than prior generation.
- Objective options & stages: multiple objectives and stand/stage configurations available
(see full specifications).